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Hardware Trust and Assurance through Reverse Engineering: A Tutorial and Outlook from Image Analysis and Machine Learning Perspectives.

• Authors : BOTERO, ULBERT J.; WILSON, RONALD; HANGWEI LU

Subjects: REVERSE engineering; PRINTED circuit design; IMAGE analysis

• Source: ACM Journal on Emerging Technologies in Computing Systems; Oct2021, Vol. 17 Issue 4, p1-53, 53p

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Classification Tree Analysis of Factors Associated with Oral Cancer Exam.

• Authors : Sheng Ge; Hangwei Lu; Qian Li

Subjects: EARLY detection of cancer; ALGORITHMS; CLASSIFICATIONFLORIDA

• Source: American Journal of Health Behavior; May/Jun2019, Vol. 43 Issue 3, p635-647, 13p

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ObNoCs: Protecting Network-on-Chip Fabrics Against Reverse-Engineering Attacks.

• Authors : HALDER, DIPAL; MERUGU, MANEESH; RAY, SANDIP

Subjects: SYSTEMS on a chip; TEXTILES; TOPOLOGY

• Source: ACM Transactions on Embedded Computing Systems; 2023 Suppl5s, Vol. 22, p1-21, 21p

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A Fast Object Detection-Based Framework for Via Modeling on PCB X-Ray CT Images.

• Authors : KOBLAH, DAVID SELASI; BOTERO, ULBERT J.; COSTELLO, SEAN P.

• Source: ACM Journal on Emerging Technologies in Computing Systems; Oct2023, Vol. 19 Issue 4, p1-20, 20p

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EVHA: Explainable Vision System for Hardware Testing and Assurance—An Overview.

• Authors : HASAN, MAHFUZ AL; MOSTAFIZ, MOHAMMAD TAHSIN; AN LE, THOMAS

Subjects: SCANNING electron microscopy; INTEGRATED circuits; GENERATIVE adversarial networks

• Source: ACM Journal on Emerging Technologies in Computing Systems; Jul2023, Vol. 19 Issue 3, p1-25, 25p

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FPIC: A Novel Semantic Dataset for Optical PCB Assurance.

• Authors : JESSURUN, NATHAN; DIZON-PARADIS, OLIVIA P.; HARRISON, JACOB

• Source: ACM Journal on Emerging Technologies in Computing Systems; Apr2023, Vol. 19 Issue 2, p1-21, 21p

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Acknowledgment to the Reviewers of Electronics in 2022.

Subjects: SCHOLARLY publishing

• Source: Electronics (2079-9292); Feb2023, Vol. 12 Issue 3, p686, 74p

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Acknowledgment to the Reviewers of AI in 2022.

Subjects: ARTIFICIAL intelligence; SCHOLARLY publishing

• Source: AI; Mar2023, Vol. 4 Issue 1, p111-113, 3p

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Detecting Hardware Trojans Using Combined Self-Testing and Imaging.

• Authors : Vashistha, Nidish; Lu, Hangwei; Shi, Qihang

Subjects: ELECTRONIC systems; INTEGRATED circuits; IMAGE processing

• Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Jun2022, Vol. 41 Issue 6, p1730-1743, 14p

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Q.U.A.I.N.T.P.E.A.X. QUantifying Algorithmically INTrinsic Properties of Electronic Assemblies via X-ray CT.

• Authors : True, John; Jessurun, Nathan; Mehta, Dhwani

• Source: Microscopy & Microanalysis; 2021 Supplement 1, Vol. 27, p1222-1225, 4p

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