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Applied Science & Technology Full Text (H.W. Wilson)

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Applied Science & Technology Full Text (H.W. Wilson)

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Applied Science & Technology Full Text (H.W. Wilson)

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Standards emerging for IC EMC measurement.

• Authors : Carlton, Ross M.¹

Subjects: *INTEGRATED circuits; ELECTRIC measurements; ELECTROMAGNETIC measurements

• Source: Test & Measurement World. Nov2003, Vol. 23 Issue 11, pE5. 3p.

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Applied Science & Technology Full Text (H.W. Wilson)

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Applied Science & Technology Full Text (H.W. Wilson)

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Applied Science & Technology Full Text (H.W. Wilson)

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Behavioral Modeling of IC Core Power-Delivery Networks From Measured Data.

• Authors : Stievano, Igor S.; Rigazio, Luca; Maio, Ivan A.

Subjects: INTEGRATED circuits; ELECTRIC measurements; ELECTRIC wire

• Source: IEEE Transactions on Components, Packaging & Manufacturing Technology. Mar2011, Vol. 1 Issue 3, p367-373. 7p.

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Applied Science & Technology Full Text (H.W. Wilson)

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Inverse Models of Voltage and Current Probes.

• Authors : Ammous, Kaiçar¹; Morel, Hervé²; Ammous, Anis¹

Subjects: *MATHEMATICAL models; *INTEGRATED circuits; VOLTAGE-frequency converters

• Source: IEEE Transactions on Instrumentation & Measurement. Nov2011, Vol. 60 Issue 12, p3898-3906. 9p.

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