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Academic Journal

The Distributed Heat Source Modeling Method for the Finite Element Simulation of IGBTs.

Subjects: INSULATED gate bipolar transistors; FINITE element method; HEAT

  • Source: IEEE Transactions on Components, Packaging & Manufacturing Technology. Jan2021, Vol. 11 Issue 1, p83-89. 7p.

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Academic Journal

Research Progress in Failure Mechanism and Health State Evaluation Index System of Welded IGBT Power Modules.

Subjects: INSULATED gate bipolar transistors; ELECTRIC insulators & insulation

  • Source: Electronics (2079-9292); Aug2023, Vol. 12 Issue 15, p3248, 27p

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  • 1-2 of  2 results for ""Zhao, Zixuan""