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Academic Journal

Current crowding and 1/f noise in polycrystalline silicon thin film transistors.

Subjects: THIN film transistors; ELECTRIC properties of silicon; ELECTRONICS

  • Source: Journal of Applied Physics; 10/15/2001, Vol. 90 Issue 8, p4019, 8p, 4 Diagrams, 1 Chart, 7 Graphs

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Academic Journal

Experimental verification of prediction method for electromigration failure of polycrystalline lines.

Subjects: ELECTRODIFFUSION; POLYCRYSTALLINE semiconductors; ELECTRIC properties of silicon

  • Source: Journal of Applied Physics; 3/15/2000, Vol. 87 Issue 6, p2785, 7p, 12 Black and White Photographs, 1 Diagram, 1 Chart

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Academic Journal

The electrical properties of terbium ions in crystalline Si.

Subjects: TERBIUM; ELECTRIC properties of silicon; SEMICONDUCTORS

  • Source: Journal of Applied Physics; 2/15/1999, Vol. 85 Issue 4, p2093, 7p, 8 Graphs

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Academic Journal

Geometric and electronic structures of silicon-sodium binary clusters. II. Photoelectron...

Subjects: COMPLEX ions; ANIONS; ELECTRIC properties of silicon

  • Source: Journal of Chemical Physics; 12/15/1997, Vol. 107 Issue 23, p10029, 15p, 3 Diagrams, 6 Charts, 40 Graphs

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Academic Journal

Ni and Ni silicide Schottky contacts on n-GaN.

Subjects: NICKEL; ELECTRIC properties of silicon; DIODES

  • Source: Journal of Applied Physics; 7/15/1998, Vol. 84 Issue 2, p881, 6p, 1 Diagram, 2 Charts, 3 Graphs

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Academic Journal

Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon.

Subjects: ALUMINUM oxide; ELECTRIC breakdown; FIELD-effect transistors

  • Source: IEEE Transactions on Electron Devices. Jan2000, Vol. 47 Issue 1, p121. 8p. 6 Black and White Photographs, 2 Charts, 7 Graphs.

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  • 1-10 of  58 results for ""ELECTRIC properties of silicon""