Authors : Dabiré BAM; Laboratoire Géosciences et Environnement (LaGE), Département Des Sciences de La Terre, Université Joseph Ki-Zerbo, Ouagadougou, Burkina Faso.; Sako A
Authors : Yin H; Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, USA.; Laboratory for Soft Machines & Electronics, School of Packaging, Michigan State University, East Lansing, MI, 48824, USA.