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Forensic application of Ir spectroscopy for the analysis of automobile paint traces.

• Authors : Kaur, Navjot; Jain, Vishesh; Verma, Priyanka

Subjects: AUTOMOTIVE painting & paint shops; HIT & run accidents; PAINT

• Source: AIP Conference Proceedings; 2023, Vol. 2558 Issue 1, p1-5, 5p

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Sequencing and identification TOF-SIMS analysis on D9 alloy.

• Authors : Sivabharathy, M.; Praveen, B. M.; Aithal, P. S.

Subjects: ALLOY analysis; DEPTH profiling; NANOTECHNOLOGY

• Source: AIP Conference Proceedings; 9/28/2022, Vol. 2518 Issue 1, p1-7, 7p

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HERITAGE SCIENCE – SYNERGY BETWEEN HUMANITIES AND SCIENCES. CASE STUDY OF GIERCZYN PARISH CHURCH.

• Authors : Pawełkowicz, Sylwia Svorová; Witkowski, Michał

Subjects: HUMANITIES; ART history; SOCIOECONOMICS

• Source: International Multidisciplinary Scientific Conference on Social Sciences & Arts SGEM; 2019, Vol. 6, p53-60, 8p

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REHABILITATION OF TWO 1890s METAL TRUSS BRIDGES.

• Authors : PULLARO, JOSEPH J.

• Source: International Engineering History & Heritage; 2001, p212-220, 9p

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STONE CONSERVATION WITHIN HISTORIC SCOTLAND FROM 1954 TO THE PRESENT DAY.

• Authors : BOYES, N.

Subjects: STONE; PRESERVATION of monuments; ENVIRONMENTAL monitoringSCOTLAND

• Source: Aspects of Stone Weathering, Decay & Conservation: Proceedings of the 1997 Stone Weathering & Atmospheric Pollution Network Conference (Swapnet '97); 1999, p170-178, 9p

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The ISI visual design editor generator.

• Authors : Goldman, N.M.; Balzer, R.M.

• Source: Proceedings 1999 IEEE Symposium on Visual Languages; 1999, p20-27, 8p

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Chinese seal identification.

• Authors : Ju-Pei Chou; Hu-Sheng Chen

• Source: IEEE International Carnahan Conference on Security Technology, Crime Countermeasures; 1990, p51-53, 3p

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Correlating DNA-PAINT and single-molecule FRET for multiplexed super-resolution imaging.

• Authors : Gregor, Ingo; Koberling, Felix; Erdmann, Rainer

• Source: Proceedings of SPIE; 11/5/2019, Vol. 11246, p112460L-112460L-7, 1p

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X-ray tubes incorporating carbon nanotube cathodes.

• Authors : Espinosa, R.J.; McKenzie, C.; Munson, M.

• Source: Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786); 2004, p253-254, 2p

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Throughput comparison of random access schemes in 3GPP.

• Authors : Vukovic, I.N.

• Source: 57th IEEE Semiannual Vehicular Technology Conference, 2003. VTC 2003-Spring; 2003, p616-616, 1p

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