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THE OBSERVATORY. Mental Health.

Subjects: *COMPETENCY assessment (Law); *DIAGNOSIS of bipolar disorder; *BIPOLAR disorder

• Source: Medical Laboratory Observer (MLO). May2018, Vol. 50 Issue 5, p10-11. 2p.

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Using 3D Scanning to Inspire STEM.

• Authors : KERNS, JEFF

Subjects: *3-D printers; *THREE-dimensional printing; *EDUCATIONAL technologyUNITED States

• Source: Machine Design. Nov2015, Vol. 87 Issue 11, p8-8. 2/3p. 1 Color Photograph.

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Science Matters.

• Authors : Odell, Bill¹

Subjects: *SCHOOL facilities; *FACILITIES; *SCHOOL buildings

• Source: American School & University. Nov2005, Vol. 78 Issue 3, p296-298. 3p. 1 Color Photograph.

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Elementary schools.

Subjects: ELEMENTARY school facilities; BUILDING design & constructionUNITED States

• Source: American School & University. Nov96, Vol. 69 Issue 3, p26. 34p. 138 Color Photographs, 8 Diagrams.

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THE OBSERVATORY. Industry News.

Subjects: *EDUCATION of medical technologists; *INDUSTRIES; *LABOR supply

• Source: Medical Laboratory Observer (MLO). May2018, Vol. 50 Issue 5, p11-11. 1/3p.

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THE OBSERVATORY. Cardiac Biomarkers.

Subjects: *CARDIOVASCULAR disease prevention; *HEART disease related mortality; *BLOOD testing

• Source: Medical Laboratory Observer (MLO). May2018, Vol. 50 Issue 5, p11-11. 1/3p.

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PROFILES.

Subjects: *UNITED States education system; *SCHOOL breakfast programs; *LOW-income studentsOKLAHOMASHARE Our Strength SHARE Our Strength SHARE Our Strength 621061456 ; CHICAGO Public Schools

• Source: American School & University. Mar2013, Vol. 85 Issue 7, p50-50. 1p.

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Going solar.

Subjects: *SOLAR cells; *PHOTOVOLTAIC power systems; *ENERGY conservationWYANDOTTE (Mich.); MICHIGANJOHNSON Controls Inc. JOHNSON Controls Inc. JOHNSON Controls Inc. JCI

• Source: American School & University. May2009, Vol. 81 Issue 10, p40-40. 1/2p. 1 Color Photograph.

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Young Engineers Need You!

• Authors : Wong, Bill

Subjects: *SCIENCE fairs; *SCIENCE education; *ENGINEERING educationUNITED States

• Source: Electronic Design. 1/31/2008, Vol. 56 Issue 2, p24-24. 1p. 1 Color Photograph.

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SURVEY SAYS: Science & technology critical to U.S. security.

• Authors : Paterson, Ian; Kren, Lawrence

Subjects: *SURVEYS; *MATHEMATICS education; *SCIENCEBAYER Corp.

• Source: Machine Design. 9/4/2003, Vol. 75 Issue 17, p104-104. 2/3p.

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