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Authors :
Tanide A; Rakusei Operation Center, SCREEN Holdings Co., Ltd., 322 Furukawa-cho, Fushimi, Kyoto 612-8486, Japan.; Nakamura S
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Source:
ACS omega [ACS Omega] 2020 Oct 08; Vol. 5 (41), pp. 26776-26785. Date of Electronic Publication: 2020 Oct 08 (Print Publication: 2020).Publisher: American Chemical Society Country of Publication: United States NLM ID: 101691658 Publication Model: eCollection
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Authors :
Heijkers S; Research group PLASMANT, Department of Chemistry, University of Antwerp, Universiteitsplein 1, BE-2610 Wilrijk-Antwerp, Belgium.; Aghaei M
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Source:
The journal of physical chemistry. C, Nanomaterials and interfaces [J Phys Chem C Nanomater Interfaces] 2020 Apr 02; Vol. 124 (13), pp. 7016-7030. Date of Electronic Publication: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101299949 Publication Model: Print-Electronic
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Authors :
Duan Y; C-CSE, MS K484, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA. ; Wang C
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Source:
Analytical chemistry [Anal Chem] 2005 Aug 01; Vol. 77 (15), pp. 4883-9.Publisher: American Chemical Society Country of Publication: United States NLM ID: 0370536 Publication Model: Print Cited
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Authors :
Chur S; Plasma Interface Physics, Ruhr-University Bochum, 44801 Bochum,Germany.; Kulik L
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Source:
ACS omega [ACS Omega] 2024 Jun 27; Vol. 9 (27), pp. 29234-29243. Date of Electronic Publication: 2024 Jun 27 (Print Publication: 2024).Publisher: American Chemical Society Country of Publication: United States NLM ID: 101691658 Publication Model: eCollection
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Authors :
Sovizi S; Faculty of Chemistry, Biological and Chemical Research Centre, University of Warsaw, Żwirki i Wigury 101, 02-089, Warsaw, Poland.; Angizi S
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Source:
Chemical reviews [Chem Rev] 2023 Dec 27; Vol. 123 (24), pp. 13869-13951. Date of Electronic Publication: 2023 Dec 04.Publisher: American Chemical Society Country of Publication: United States NLM ID: 2985134R Publication Model: Print-Electronic
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