Search Results

Normal-incidence multilayer Laue lens focuses hard x-rays.

• Authors : Wallace, John

Subjects: *NANOFILMS; *X-rays; *CELLS

• Source: Laser Focus World. May2017, Vol. 53 Issue 5, p17-18. 2p.

Record details

Quantum dots allow normal-incidence imaging.

• Authors : Wallace, John

• Source: Laser Focus World. 2004, Vol. 40, Issue 6, pages. 2

Record details

Normal-incidence x-ray mirrors become practical. (news breaks).

• Source: Laser Focus World. 2003, Vol. 39, Issue 2, pages. 1

Record details

Symmetry improves interferometer.

• Authors : Wallace, John

Subjects: *INTERFEROMETERS; *OPTICAL instrumentsZYGO Corp. 052536570 ZYGO Corp. ZYGO Corp. 052536570 052536570 ZYGO Corp. 052536570 ZIGO

• Source: Laser Focus World. Jul2000, Vol. 36 Issue 7, p24. 3p. 2 Diagrams.

Record details

Laser-based systems easily find semiconductor defects.

• Authors : Chinnock, Chris

Subjects: INDUSTRIAL lasers; SEMICONDUCTOR defects; DETECTORS

• Source: Laser Focus World; Nov94, Vol. 30 Issue 11, p59, 5p, 1 Black and White Photograph, 1 Diagram, 3 Graphs

Record details

Normal-incidence x-ray mirrors become practical. (news breaks).

• Source: Laser Focus World. Feb, 2003, Vol. 39 Issue 2, p13, 1 p.

Record details

Multilayer coatings boost grating efficiency.

• Authors : Noaker, Paula M.

Subjects: *DIFFRACTION gratings; *SPECTRUM analysis instruments; *DOPPLER effect

• Source: Laser Focus World. Jun99, Vol. 35 Issue 6, p35. 3p. 1 Graph.

Record details

Laser-machined pits replace coating flaws.

• Authors : Wallace, John

Subjects: *OPTICAL coatings; *DIELECTRIC devices; *INDUSTRIAL lasersLAWRENCE Livermore National Laboratory ; UNIVERSITY of California, Berkeley

• Source: Laser Focus World. Apr2011, Vol. 47 Issue 4, p43-47. 3p.

Record details

Development of optical thin-film modeling forges ahead.

• Authors : MACLEOD, ANGUS

Subjects: OPTICAL thin films; ABELES, Florin; OPTICAL constants

• Source: Laser Focus World; Jul2013, Vol. 49 Issue 7, p27-30, 4p

Record details

Thin films provide wide-angle correction for waveplate components.

• Authors : Tan, Kim; Hendrix, Karen; McKenzie, Paul

Subjects: LIGHT filters; SPECTRUM analysis; SPECTRAL reflectance

• Source: Laser Focus World; Mar2007, Vol. 43 Issue 3, p59-62, 4p

Record details