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Publication : ieee transactions on nuclear science
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Applied Science & Technology Full Text (H.W. Wilson)

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Applied Science & Technology Full Text (H.W. Wilson)

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Radiation Hardness of Modern Photogate Pixels Under Total Ionizing Dose: Impact of Pixel Pitch and Electron or Hole Collection

  • Source: IEEE Transactions on Nuclear Science; August 2024, Vol. 71 Issue: 8 p1766-1773, 8p

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