Search Results

PC's IRQ7 and INT1Ch measure currents, charges.

• Authors : Suresh, K

Subjects: INTERRUPTS (Computer systems); ELECTRIC measurements

• Source: EDN. 10/12/2000, Vol. 45 Issue 21, p196. 2p. 1 Diagram.

Record details

EDN test & measurement.

Subjects: ELECTRIC measurements

• Source: EDN. 05/07/98, Vol. 43 Issue 10, p188. 3p. 2 Black and White Photographs.

Record details

Jitter Measurement: Pinning down timing at the leading edge.

• Authors : Strassberg, Dan

Subjects: ENGINEERING equipment; ELECTRIC measurements

• Source: EDN. 07/22/99, Vol. 44 Issue 15, p99. 5p. 2 Color Photographs, 3 Diagrams.

Record details

Researchers listen to the sounds of CMOS.

Subjects: ELECTRIC measurements; COMPLEMENTARY metal oxide semiconductors; NOISE measurementUNITED StatesNATIONAL Institute of Standards & Technology (U.S.)

• Source: EDN. 7/20/2006, Vol. 51 Issue 15, p28-28. 1/6p.

Record details

Simple circuit provides high-side current sensing.

• Authors : Ossmann, M; Kazay, B

Subjects: INTEGRATED circuit design; ELECTRIC measurements

• Source: EDN. 10/12/2000, Vol. 45 Issue 21, p200. 1p. 2 Diagrams, 2 Graphs.

Record details

Applied Science & Technology Full Text (H.W. Wilson)

Record details

Applied Science & Technology Full Text (H.W. Wilson)

Record details

Applied Science & Technology Full Text (H.W. Wilson)

Record details

Applied Science & Technology Full Text (H.W. Wilson)

Record details

Applied Science & Technology Full Text (H.W. Wilson)

Record details