Search Results

Silicon Single Electron Transistors Operating at Room Temperature and Their Applications

• Authors : Miyaji, K; Hiramoto, T

• Source: Comprehensive Semiconductor Science and Technology. 2011, v. 5, p340-382.

Record details

Index

• Source: Comprehensive Semiconductor Science and Technology. 2011, v. 6, p649-766.

Record details

Assessment of Semiconductors by Scanning Electron Microscopy Techniques

• Authors : Salviati, G; Lazzarini, L; Sekiguch, T

• Source: Comprehensive Semiconductor Science and Technology. 2011, v. 4, p308-356.

Record details

Integration of Dissimilar Materials

• Authors : Kuech, T F

• Source: Comprehensive Semiconductor Science and Technology. 2011, v. 4, p1-24.

Record details

Light Emission from Silicon Nanoparticles and Related Materials

• Authors : Kanemitsu, Y

• Source: Comprehensive Semiconductor Science and Technology. 2011, v. 2, p196-212.

Record details

Optical Properties of Semiconductors

• Authors : Cardona, M; Yu, P Y

• Source: Comprehensive Semiconductor Science and Technology. 2011, v. 2, p125-195.

Record details

Silicon Single Electron Transistors Operating at Room Temperature and Their Applications

• Authors : Hiramoto T; Miyaji K

• Source: Comprehensive Semiconductor Science and Technology.

Record details

Assessment of Semiconductors by Scanning Electron Microscopy Techniques

• Authors : Chen B; Lazzarini L; Salviati G

• Source: Comprehensive Semiconductor Science and Technology.

Record details

Optical Properties of Semiconductors

• Authors : M Cardona; Y Yu

• Source: Comprehensive Semiconductor Science and Technology.

Record details

Light Emission from Silicon Nanoparticles and Related Materials

• Authors : Y Kanemitsu

• Source: Comprehensive Semiconductor Science and Technology.

Record details