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Near-field microscope images p-n junction.

• Authors : Mortensen, Paul

Subjects: *GALLIUM arsenide semiconductors

• Source: Laser Focus World. May97, Vol. 33 Issue 5, p62. 3p. 4 Color Photographs, 1 Black and White Photograph.

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Visual objective gives new view of SPM samples.

• Authors : Messenger, Heather W.

Subjects: *SCANNING probe microscopyDIGITAL Instruments Inc. DIGITAL Instruments Inc. DIGITAL Instruments Inc. 080340516

• Source: Laser Focus World. May94, Vol. 30 Issue 5, p28. 2/3p. 1 Black and White Photograph.

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NIST works on measuring problem.

Subjects: *MACHINE tool industryNATIONAL Institute of Standards & Technology (U.S.)

• Source: Quality. Oct99, Vol. 38 Issue 11, p12. 2p. 1 Color Photograph.

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New literature.

Subjects: *SEMICONDUCTOR industry

• Source: Solid State Technology. Oct96, Vol. 39 Issue 10, p213. 6p. 16 Color Photographs, 1 Black and White Photograph.

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Atomic-force microscope can watch paint dry.

• Authors : Marx, Bridget

Subjects: *MICROSCOPES; *OPTICAL instruments; *OPTICAL imagesOXFORD (England); ENGLAND

• Source: Laser Focus World. Aug2005, Vol. 41 Issue 8, p34-36. 2p.

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COMPANY NEWS.

Subjects: *CHEMICAL industry; *BUSINESS expansion; *INVESTMENTSBASF SE ; SIEGWERK Druckfarben AG

• Source: Paint & Coatings Industry. Oct2016, Vol. 32 Issue 10, p14-18. 3p.

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3-D Imaging.

• Authors : Axelrod, Norman N.¹

Subjects: *THREE-dimensional imaging; *IMAGING systems; *AUTOMATIC control systems

• Source: Quality. Jul2011 Supplement, Vol. 50, p8-11. 4p.

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Literature.

Subjects: *PAINT industry; *COATINGS industry; *CATALOGS

• Source: Paint & Coatings Industry. Oct96, Vol. 12 Issue 10, p206. 1p.

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