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RAMAN SPECTRA OF SILICON/GERMANIUM ALLOY THIN FILMS BASED ON POROUS SILICON.
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- Author(s): Chubenko, E.B.; Grevtsov, N.L.; Bondarenko, V.P.; Gavrilin, I.M.; Pavlikov, A.V.; Dronov, A.A.; Volkova, L.S.; Gavrilov, S.A.
- Source:
Journal of Applied Spectroscopy. November, 2022, Vol. 89 Issue 5, p829, 6 p.
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