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Tampered Random Variable Analysis in Step-Stress Testing: Modeling, Inference, and Applications.
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- Author(s): Ahmad, Hanan Haj; Ramadan, Dina A.; Almetwally, Ehab M.
- Source:
Mathematics (2227-7390); Apr2024, Vol. 12 Issue 8, p1248, 25p- Subject Terms:
- Source:
- Additional Information
- Abstract: This study explores a new dimension of accelerated life testing by analyzing competing risk data through Tampered Random Variable (TRV) modeling, a method that has not been extensively studied. This method is applied to simple step-stress life testing (SSLT), and it considers multiple causes of failure. The lifetime of test units under changeable stress levels is modeled using Power Rayleigh distribution with distinct scale parameters and a constant shape parameter. The research introduces unique tampering coefficients for different failure causes in step-stress data modeling through TRV. Using SSLT data, we calculate maximum likelihood estimates for the parameters of our model along with the tampering coefficients and establish three types of confidence intervals under the Type-II censoring scheme. Additionally, we delve into Bayesian inference for these parameters, supported by suitable prior distributions. Our method's validity is demonstrated through extensive simulations and real data application in the medical and electrical engineering fields. We also propose an optimal stress change time criterion and conduct a thorough sensitivity analysis. [ABSTRACT FROM AUTHOR]
- Abstract: Copyright of Mathematics (2227-7390) is the property of MDPI and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
- Abstract:
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