AI methods further develop X-beam materials examination.

Scientists at Japan's RIKEN and SPring-8 have developed a faster and easier method for conducting segmentation analysis, an important process in materials science. The new technique, published in the journal Science and Technology of Advanced Materials, uses machine learning to analyze synchrotron radiation X-ray computed tomography (SR-CT) scans. This method allows for the identification of specific regions within a material and can be used for quality control and identifying weaknesses in materials. The researchers plan to make this analysis method available to external researchers through the SPring-8 data center. [Extracted from the article]

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