Optimized energy-storage performance in Mn-doped Na0.5Bi0.5TiO3-Sr0.7Bi0.2TiO3 lead-free dielectric thin films.

[Display omitted] • Mn doping into the NBT-SBT thin films can improve the insulation performance and advance the ferroelectric properties. • The ordered cation displacement can only be maintained in a single nano-sized crystal grain, and its order scale is limited by the grain size. The nanoscale grain size is responsible for the obtained slim P - E hysteresis loops. • The 0.55NBT-0.45SBT-0.01Mn film exhibited relatively high recoverable energy storage density (∼30.5 J/cm2) and efficiency (∼65%) with reliable frequency and antifatigue stability. The 0.55Na 0.5 Bi 0.5 TiO 3 -0.45Sr 0.7 Bi 0.2 TiO 3 (0.55NBT-0.45SBT) thin films with Mn doping were fabricated on the platinum-buffered Si substrates using the sol–gel technique. The impacts of Mn doping on the structure and properties of the thin films were systematically studied. Mn doping into the thin films can limit the valence transition of Ti cations to improve the insulation performance, and advance the ferroelectric properties. Ordered B-site cation displacement can be observed from the HADDF-STEM image, which can only be maintained in a single nano-sized crystal grain, and its order scale is limited by the grain size. The 0.55NBT-0.45SBT-0.01Mn film exhibited relatively high recoverable energy storage density (∼30.5 J/cm2) and efficiency (∼65%) at 2800 kV cm−1. Frequency stability in a wide range (0.5 ∼ 20 kHz) and long-term antifatigue stability (1 × 108 switching cycles) were also obtained, indicating their future applications in advanced dielectric capacitors for energy storage. [ABSTRACT FROM AUTHOR]

Copyright of Applied Surface Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)