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In-operando fatigue behavior of gold metallization lines on polyimide substrate.
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- Author(s): Glushko, O.1,2 (AUTHOR) ; Cordill, M.J.1,2 (AUTHOR)
- Source:
Scripta Materialia. Sep2020, Vol. 186, p48-51. 4p.
- Subject Terms:
- Additional Information
- Abstract:
Although in-situ monitoring of electrical resistance of polymer-supported thin films during a mechanical test is frequently used, the impact of the magnitude of electric current on material behavior in such experiments remained unknown. Here, we report on cyclic straining of polymer-supported gold metallization lines under direct current of different magnitudes. Fatigue damage in form of localized extrusions becomes more pronounced with increasing current as a result of Joule heat and material softening. After a critical current value is reached, crack propagation results in a local decrease of line cross-section leading to thermal runaway and open circuit failure. Image, graphical abstract [ABSTRACT FROM AUTHOR]
- Abstract:
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